Handbook of Thin-Film Deposition Processes and Techniques

2016-09-20技术资料

Handbook of Thin-Film Deposition Processes and Techniques

 

书名:Handbook of Thin-Film Deposition Processes and Techniques: Principles, Methods, Equipment and Applications(2nd Ed)
作者:Krishna Seshan
出版社:Noyes Publications / William Andrew Publishing
TABLE OF CONTENTS
Foreword: Gordon Moore
Recent Changes in the Semiconductor Industry
Krishna Seshan
  1.0 Cost of Device Fabrication
  2.0 Technology Trends, Chip Size, Performance, and Moore’s Law
1. Deposition Technologies and Applications: Introduction and Overview
Werner Kern and Klaus K. Schuegraf
  1.0 Objective and Scope of this Book
  2.0 Importance of Deposition Technology in Modern Fabrication Processes
  3.0 Classification of Deposition Technologies
  4.0 Overview of Various Thin Film Deposition Technologies
  5.0 Criteria for the Selection of a Deposition Technology for Specific Applications
  6.0 Summary and Perspective for the Future
2. Silicon Epitaxy by Chemical Vapor Deposition
Martin L. Hammond
  1.o Introduction
  2.0 Theory of Silicon Epitaxy by CVD
  3.0 Silicon Epitaxy Process Chemistry
  4.0 Commercial Reactor Geometries
  5.0 Theory of Chemical Vapor Deposition
  6.0 Process Adjustments
  7.0 Equipment Considerations for Silicon Epitaxy
  8.0 Other Equipment Considerations
  9.0 Defects in Epitaxy Layers
  10.0 Safety
  11.0 Key Technical Issues
  12.0 New Materials Technology for Silicon Epitaxy
  13.0 Low Temperature Epitaxy
3. Chemical Vapor Deposition of Silicon Dioxide Films
John Foggiato
  1.0 Introduction
  2.0 Overview of Atmospheric Pressure CVD
  3.0 Plasma Enhanced CVD
  4.0 Properties of Dielectric Films
  5.0 New Deposition Technologies
  6.0 Future Directions for CVD of Dielectric Films
4. Metal Organic Chemical Vapor Deposition
John L. Zitko
  1.0 Introduction
  2.0 Applications of MOCVD
  3.0 Physical and Chemical Properties of Sources Used in MOCVD
  4.0 Growth Mechanisms, Conditions, and Chemistry
  5.0 System Design and Construction
  6.0 Future Developments
5. Feature Scale Modeling
Vivek Singh
  1.0 Introduction
  2.0 Components of Etch and Deposition Modeling
  3.0 Etch Modeling
  4.0 Etch Examples
  5.0 Deposition Modeling
  6.0 Deposition Examples
  7.0 Real Life
6. The Role of Metrology and Inspection to Semiconductor Processing
Mark Keefer, Rebecca Pinto, Cheri Dennison, James Turlo
  1.0 Overview
  2.0 Introduction to Metrology and Inspection
  3.0 Metrology and Inspection Trends
  4.0 Theory of Operation, Equipment Design Principles, Main Applications, and Strengths and Limitations of Metrology and Inspection Principles
7. Contamination Control, Defect Detection and Yield Enhancement in Gigabit Manufacturing
Suresh Bhat and Krishna Seshan
  1.0 Introduction
  2.0 Contamination and Defect Goals for ULSI Devices
  3.0 Sources of Particles
  4.0 Contamination and Defect Detection: Tools of the Trade
  5.0 Advanced Techniques for Trace Contamination Monitoring
  6.0 Substrate Surface Preparation Techniques
  7.0 Challenges to ULSI (Gigabit) Contamination Control
  8.0 Process Evolution
  9.0 Evolution of Circuit Based Electrical Defect Detection
8. Sputtering and Sputter Deposition
Stephen Rossnagel
  1.0 Introduction
  2.0 Physical Sputtering Theory
  3.0 Plasmas and Sputtering Systems
  4.0 Deposition Rates and Efficiencies
  5.0 Reactive Sputter Deposition
  6.0 Sputtering Systems
9. Laser and Electron Beam Assisted Processing
Cameron A. Moore, Zeng-qi Yu, Lance R. Thompson, George J. Collins
  1.0 Introduction
  2.0 Beam Assisted CVD of Thin Films
  3.0 Submicron Pattern Delineation with Large Area Glow Discharge Pulsed Electron Beams
  4.0 Beam Induced Thermal Processes
10. Molecular Beam Epitaxy: Equipment and Practice
Walter S. Knodle and Robert Chow
  1.0 The Basic MBE Process
  2.0 Competing Deposition Technologies
  3.0 MBE Grown Devices
  4.0 MBE Deposition Equipment
  5.0 Principles of Operation
  6.0 Recent Advances
  7.0 Future Developments
11. Ion Beam Deposition
John R. McNeil, James J. McNally, Paul D. Reader
  1.0 Introduction
  2.0 Overview of Ion Beam Applications
  3.0 Ion Beam Probing
  4.0 Substrate Cleaning with Ion Beams
  5.0 Applications
12. Chemical Mechanical Polishing
Kenneth C. Cadien
  1.0 Introduction
  2.0 Processing
  3.0 Polish Equipment
  4.0 History
  5.0 Innovations
  6.0 Automation
  7.0 Wafer/Pad Relative Motion
  8.0 Future Challenges
13. Organic Dielectrics in Multilevel Metallization of Integrated Circuits
Krishna Seshan, Dominic J. schepis, Laura B. Rothman
  1.0 General Introduction
  2.0 Historical Perspective
  3.0 Fundamental Chemistry of Organic Dielectrics
  4.0 Processing of Polymer Films
  5.0 Process Integration with Organic Dielectrics
  6.0 Reliability
  7.0 Performance Advantages of Organic Dielectrics
14. Performance, Processing, and Lithography Trends
Krishna Seshan
  1.0 Introduction
  2.0 Scaling the Transistor
  3.0 Low Resistance: Change to Copper-Based Metallurgy
  4.0 Trend to Low K Materials
  5.0 Lithography and Planarization
  6.0 Challenges to Contamination and Cleaning
  7.0 Summary
Index  
薄膜沉积手册第二版,全英文的,非扫描版,很清晰,讲解十分全面,对于从事薄膜材料和薄膜工艺相关生产和研究的同行们来说,是一本十分难得的值得学习和收藏的参考资料。。
pl:看到小木虫上出现了材料物理分类,欣喜,发本材料物理相关的书籍顶一下。。:D
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